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The X-ray diffraction (XRD) patterns were measured by Bruker D8 Advance Powder with Cu Ka radiation (λ = 1.5406 Å). We operated in the 2θ range from 5° to 40°, by using the samples spin-coated on the ...
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The software ReciPro makes various crystallographic calculations, visualizes a crystal structure, simulates a diffraction pattern and high-resolution TEM image, indexes diffraction spots, plots ...